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EE Times-India
Test & Measurement   EE Times-India Home / Test & Measurement Outlook 2010   VLSI Design Conference 2010   Next-gen video surveillance gets smarter, high-def

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Spectrum analyser packs touchscreen for ease of use
Aeroflex's 3250 series spectrum analysers pack an optional 8GHz tracking generator to include testing on higher frequencies used for popular wireless applications.





 
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