Controlled Baseline One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree Dual 12-Bit Voltage Output DAC Programmable Settling Time 3 µs in Fast Mode 10 µs in Slow Mode Compatible With TMS320 and SPI Serial Ports Differential Nonlinearity <0.5 LSB Typ Monotonic Over Temperature Direct Replacement for TLC5618A applications Digital Servo Control Loops Digital Offset and Gain Adjustment Industrial Process Control Machine and Motion Control Devices Mass Storage Devices Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. SPI and QSPI are trademarks of Motorola, Inc. Microwire is a trademark of National Semiconductor Corporation.