Test & Measurement [T&M/Application Notes][Page 12]

Top story Articles

Application Notes (Sorted By Date)

Low-pass risetime filters for time domain applications (31/08/01)
Ultra-wideband differential measurements using PSPL BALUNs (31/08/01)
Picosecond pulse generators for UWB radars (31/08/01)
10ps risetime transmission and TDR measurements using the PSPL 4015B 15ps pulse generator and HP 54124A 50GHz oscilloscope (31/08/01)
Eye diagrams of PSPL coaxial components (31/08/01)

Pulse measurements in the picosecond domain (31/08/01)
Fresnel insertion loss measurement (29/08/01)
Distance and length measurement (29/08/01)
Time of flight measurements (29/08/01)
Rayleigh backscatter fiber calibration (29/08/01)

Return loss measurements (29/08/01)
Return loss measurements of -14dB connectors (29/08/01)
Fiber amplifier related measurements (29/08/01)
Rayleigh insertion loss measurement (29/08/01)
Guidance notes on wiring of power line filters (22/08/01)

Thyristor/Diode measurement with a multimeter (21/08/01)
Calculation of junction temperature (20/08/01)
Heatsink issues for IGBT modules (20/08/01)
Using the Chariot TCL API to create a Chariot test (18/06/01)
Running Chariot tests longer than 99 hours (18/06/01)

Accurate characterization of source Spectra using an optical spectrum analyzer (25/05/01)
A flexible waveform generator using OmniSys and instrumentation (25/05/01)
Testing to ensure your P-NNI implementations is ready to plug-and-play (25/05/01)
A software algorithm for implementing automatic power ranging (25/05/01)
Extracting and using J-models to estimate ACPR in direct conversion transmitters (26/04/01)

RoboClock family test mode (27/03/01)
RoboClock II TEST mode (27/03/01)
Basic semiconductor thermal measurement (06/12/00)
SuperHyway provides SoC backbone (01/12/00)

589 records, page 12 of 12

Article review

1 • 2 • 3 • 4 • 5 • 6 • 7 • 8 • 9 • 10 • 11 • 12

Win an iPad from EE Times-India!

And we think you're smart
enough to win it.

The engineer who creates the biggest discussion on eeForums wins the iPad. State your opinion, ask a question; it's your choice—just keep your comments interesting. Oh, and yes, industry-specific please.
From there on in, your success is measured by every view and reply. The discussion that creates the biggest buzz by January 31 gets the prize.

Joining instructions:
(If you are already a member of EE Times-India, skip to step 3)
1. First, register as a member of EE Times-Asia at http://www.eetasia.com/register.do.
2. Verify your membership by clicking on the automated registration message sent to you.
3. Log-on to EE Times-India at http://www.eetasia.com/login.do.
4. Post a message on any of the categories at http://forum.eetindia.co.in

Point system: Each message view gets one (1) point while each valid reply gets four (4) points. In case of a tie, the editors will choose the winner based on a review of the message and replies.
Contest duration: December 21, 2010 to January 31, 2011.

...win the iPad now

Hot Articles

Search EE Times India

eMedia Asia	EE Times - Asia\|\|\|\|IIC-China
Global Sources	\|\|\|Electronic Components\|Computer Products\|Trade Show Center
TechInsights	EE Times\|ESM Online\|EE Times JAPAN