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| 2008-11-27 | UMC validates high-k process at 45nm UMC validates high-k process at 45nm |
| 2007-11-01 | Dealing with IP at smaller process nodes Dealing with IP at smaller process nodes |
| 2007-11-01 | Addressing the challenges of process node transition Addressing the challenges of process node transition |
| 2007-11-01 | 45nm designs face I/O planning, placement challenges 45nm designs face I/O planning, placement challenges |
| 2007-10-08 | Xpress tech provides compression levels exceeding 100X Mentor Graphics has announced new Xpress tech in its TestKompress ATPG product to address the industry's increasing demand for scan test compression. |
| 2007-03-15 | Vistec designs photomask CD measurement system for 45nm Vistec designs photomask CD measurement system for 45nm |
| 2007-01-29 | TI exits digital logic process race TI exits digital logic process race |
| 2007-01-15 | Xilinx sets up R&D team in Singapore To assist in the development of its next-generation 45nm platform FPGA family, Xilinx Inc. has established an R&D team in its Asia-Pacific headquarters. This team will develop new design tools and implementation solutions to address the challenges of the 45nm process node. |
| 2005-11-08 | Panelists ponder challenges of 45nm Panelists ponder challenges of 45nm |
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