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| 2011-07-12 | The true cost of off-the-shelf analogue ICs Any associated up-front non-recurring engineering costs must be considered along with hard tooling—wafer fabrication masks, test hardware and software and more. |
| 2010-07-20 | Shorten test time with package-based MBIST strategy Shorten test time with package-based MBIST strategy |
| 2008-10-23 | Barriers to MEMS commercialisation A major barrier to MEMS commercialisation has been the lack of design for manufacturing and test strategies. |
| 2003-12-01 | How to automate stress tests The goal of stress testing is to find system-level interaction problems. Here's a strategy for developing a successful stress-test framework. |
| 2006-11-15 | Cadence, IBM team up to accelerate ASIC design Cadence, IBM team up to accelerate ASIC design |
| 2005-12-22 | IP reuse needs a verification strategy The concept of reuse seems simple and easy in theory, but there are a number of obstacles that design and verification teams must address to be successful. |
| 2001-04-23 | Using NAND tree test circuits for input parametric testing Using NAND tree test circuits for input parametric testing |
| 2001-04-23 | Guidelines for supplying test vector simulations Guidelines for supplying test vector simulations |
| 2001-05-25 | ASIC I/O test considerations ASIC I/O test considerations |
| 2001-06-01 | Practical DFT leads to highly testable ASICs Combine classic design-for-test methodologies, such as scan and BIST, with practical DFT, to clear the path to a highly testable design |
| 2002-01-16 | Importance of signal analysis for board designers This technical article discusses some of the test tools engineers need to understand that are necessary for signal integrity analysis in board design. |
| 2002-06-12 | CL10K NoFault testing This application note describes how Clear Logic's NoFault test method provides 100-percent stuck-at fault coverage, without the need for customer design or test support. |
| 2002-12-02 | Open source hardware This technical article discusses how open-source techniques in hardware design are still impossible to achieve with the current technology available to engineers. |
| 2003-09-01 | Using automatic Emscan in high-speed PCB design Emscan claims that its system provides an efficient way of evaluating the replacement component's usability, reducing production cost without any compromise to EMI integrity. |
| 2004-04-16 | Diagnostic test for design validation Diagnostic test for design validation |
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