- Article
(60) -
Forum
(0) -
Blog
(0)
total search60 articles
sort by relevance
sort by date
| 2007-09-17 | Switch drivers suit bench-top, ATE environments Switch drivers suit bench-top, ATE environments |
| 2007-08-22 | ADI touts in-amp with gain of 1,000 ADI has introduced a digitally programmable instrumentation amp for DAQ systems and ATE requiring fast, accurate measurement with robust signal conditioning over large voltage ranges. |
| 2007-08-13 | Slowdown in ATE industry may lead to downturn Slowdown in ATE industry may lead to downturn |
| 2007-03-23 | Planning the verification process with SystemVerilog The best way for the verification team to match the automatic tests with their corresponding design features is via functional coverage metrics. |
| 2006-12-12 | Cadence, Advantest enter automotive testing partnership Cadence Design Systems Inc. and Advantest Corp. have announced a collaborative partnership to deliver a methodology for zero-defect testing of digital automotive electronics. This collaboration will enable faster time-to-market and more complete testing of complex digital devices for new automobiles. |
| 2006-10-31 | Cadence, Source III collaborate on test validation Cadence Design Systems Inc. and Source III Inc. are collaborating to enable improved test validation and faster test conversion for enhanced chip quality. |
| 2006-10-11 | Dual op amp lowers noise by 80% Analog Devices Inc. (ADI) has unrolled a dual op amp that lowers noise by 80 per cent without sacrificing precision for medical, instrumentation, ATE and other industrial applications. |
| 2006-08-31 | SIP relays save board space in ATE apps SIP relays save board space in ATE apps |
| 2006-07-11 | ATE industry might decelerate this year, warns Canaccord analyst ATE industry might decelerate this year, warns Canaccord analyst |
| 2006-03-16 | Intersil announces pin driver for ATE equipment Intersil announces pin driver for ATE equipment |
| 2005-12-16 | Unified methodology enables full-chip test The article will discuss shortcomings of today's test flows and propose a unified methodology for implementing full-chip test. |
| 2005-12-20 | Semtech ATE pin-driver combines signal drive and receive Semtech ATE pin-driver combines signal drive and receive |
| 2005-09-02 | Inovys debuts analysis tool for ATE Inovys debuts analysis tool for ATE |
| 2005-10-20 | Differential amps span DC to 10GHz Inphi announced three new differential amplifiers developed specifically to meet the challenges encountered in designing broadband test and measurement equipment, ATE and a wide range of aerospace and military apps |
| 2000-12-01 | The advantage of using logic BIST for ASIC designs This technical paper reveals the advantage of using logic BIST for ASIC designs. |
| 2001-04-15 | New thinking needed amid runaway test costs There is a need to achieve test-cost reductions that rival the reductions in wafer fabrication costs to ensure continued growth of semiconductor markets. ATE should not wait for someone else to do it. |
| 2001-09-13 | Frost-free environment for the thermal testing of high performance MCMs with RF circuitry This application note describes a frost-free enclosure, with plug-and-play ATE interface, for the thermal testing of high-performance multichip module (MCM) with RF circuitry. |
| 2002-02-25 | Design for testability: Using emulation-based ATE Design for testability: Using emulation-based ATE |
| 2002-05-07 | Simplify manufacturing by using automatic test equipment for on-board programming This application note provides design information and benchmark data to help ATE vendors integrate Flash memory programming into their manufacturing test procedure. |
| 2002-05-13 | An electrostatically actuated micro-relay This application note illustrates the design, function and purpose of the electrostatically actuated microrelay. |
| 2002-08-16 | Test systems move to the desktop This technical article introduces a low-cost, efficient desktop test system aimed to replace traditional, expensive automated testing systems. |
| 2002-10-16 | Passing the SoC test with flying colors The key concern of product developers, SoC design houses and wafer fabs is to provide higher performance and functionalities of SoC at the lowest cost. |
| 2002-11-01 | Embedded ATE boosts 10Gb Ethernet time-to-market Embedded ATE boosts 10Gb Ethernet time-to-market |
| 2003-04-16 | DBIST answers advanced SoC test challenges Due to the exponential growth in the time and cost to apply scan tests on sophisticated SoCs, Synopsys Inc. releases its DBIST as a key capability in its new product for advanced SoC testing, the DFT Compiler SoCBIST. |
| 2003-06-02 | Network analyzer improves yield, reduces test cost With MVNA technology integrated into ATE, testing is more representative to the real-world conditions, minimizing the risk of defect components finding their way into end-products. |
| 2004-07-16 | Testing multibus system-on-chip devices Multiple-clock domain buses require |
| 2004-08-02 | Testing SoC interconnects using boundary scan Delay violations occurring in the interconnects of high-speed SoCs can be tested using JTAG boundary scan architecture. |
| 2004-11-01 | Integrating design and test increases reliability To aid designers with product development, test tools must integrate tightly with embedded-software and EDA tools. |
| 2004-12-01 | Vector generation for structural testers Sizing of modern ASICs and SoCs requires an array of vectors for comprehensive testing to achieve the required quality levels. |
| 2005-05-16 | Across the flow: DFM's many faces EDA toolmakers, designers forge partnership to develop new DFM process flow |
Most Popular Articles
Search EE Times India
Max's Cool Beans
Strange modes of transport and other "stuff"
Someone just pointed me at a YouTube video that claims to show the world's first e-powered multicopter flight...
