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| 2012-04-26 | Measuring intermodulation distortion with network analyser Understand how to make accurate intermodulation distortion measurements with Agilent PNA-X network analyser. |
| 2012-04-24 | Tips for measuring noise figure Discover how to minimise the uncertainties in noise figure measurements. |
| 2012-01-05 | Scalar network analysis using U2000 USB power sensors Find how to make accurate stimulus-response measurements using U2000 Series USB power sensors, ESG/MXG/PSG signal generators, broadband couplers, and power splitters. |
| 2011-09-20 | Use wide-bandwidth sampling scope to probe high-speed signal Know how to make probe based measurements both simple and accurate for the Agilent 86100 Wide Bandwidth Oscilloscope. |
| 2011-09-19 | Understanding time-domain response of scopes, probes Learn about the measurements of the time-domain response of the Agilent Technologies InfiniiMax probes and 54855A 20 GSa/s real-time oscilloscopes. |
| 2011-08-02 | High-power measurements using E5072A ENA Series Network Analyser High-power measurements using E5072A ENA Series Network Analyser |
| 2011-07-29 | Active-device characterisation in pulsed operation using PNA-X Read about pulsed S-parameter measurements using the PNA-X Series and measurement techniques that enable power-dependent active-device characterisation. |
| 2011-06-15 | Resistance measurements using Agilent B2900A Series Resistance measurements using Agilent B2900A Series |
| 2011-04-22 | Scalar network analysis with U2000 Series USB power sensors The Agilent U2000 Series USB power sensor is an instrument that performs RF and microwave power measurements. |
| 2011-04-20 | Making EMI compliance measurements Making EMI compliance measurements |
| 2011-04-18 | Making custom OFDM measurements using 89600B VSA software Making custom OFDM measurements using 89600B VSA software |
| 2011-03-08 | AWG delivers high resolution, wide bandwidth This functionality in Agilent's M8190A arbitrary waveform generators helps make reliable, repeatable measurements and create realistic signal to test radar, satellite and electronic warfare products. |
| 2011-01-12 | Measure transient optical power Read about 8-port optical power meters that allow measurements with a small self-contained programmable instrument that is used together with a controller computer. |
| 2011-01-03 | How to make the most accurate digital measurements How to make the most accurate digital measurements |
| 2010-08-10 | Handheld spectrum analyser eases RF system testing Agilent offers the N9342C handheld spectrum analyser (HSA) that eases field testing of RF systems by providing faster, more precise measurements and a range of user customisation and ergonomic features. |
| 2010-06-22 | Scope handles 50Mbit/s to 40Gbit/s signals Agilent's 86100D DCA-X oscilloscope offers high analogue bandwidth, low noise and low jitter measurements on signals from 50Mbit/s to over 40Gbit/s. |
| 2009-11-24 | Agilent radar measurements Agilent radar measurements |
| 2009-09-16 | SMU gives power while taking measurements SMU gives power while taking measurements |
| 2008-09-04 | Power sensors provide 55 dB dynamic range Agilent releases thermocouple power sensors that offer widest dynamic range in average-power measurements. |
| 2008-09-03 | Software tests PLL designs Agilent has introduced its advanced software for making precise phase-locked loop measurements. |
| 2008-08-28 | 'Smallest' WiMAX scanning solution debuts Agilent has announced a new software feature for handheld wireless measurements on its E6474A platform. |
| 2008-03-14 | Signal source analyser targets RF apps Agilent Technologies Inc. has announced Signal Source Analyser that can be used for traditional high-quality phase-noise measurements such as VCO evaluation and PLL testing, jitter measurements and signal source analysis. |
| 2007-08-01 | Agilent one-box tester combines 7.2/2Mbps measurements Agilent one-box tester combines 7.2/2Mbps measurements |
| 2007-07-10 | Agilent touts LXI-compliant power meter Agilent touts LXI-compliant power meter |
| 2007-03-01 | Agilent, DECOMSYS partner in time-correlated measurement system Agilent, DECOMSYS partner in time-correlated measurement system |
| 2006-12-27 | Vector network analysers address RF measurement challenges The trend towards greater subsystem integration is changing the way RF and microwave devices are being tested. This article discusses how vector network analysers are adapting. It examines advances in VNA calibration, which ensures the accuracy associated with two-port S-parameter measurements is maintained. |
| 2005-10-19 | Spectrum analyzer for <$10,000 Agilent unveiled a compact, high-performance spectrum analyzer priced under $10,000 that promises to enable R&D and manufacturing engineers and technicians to make precision RF measurements with speed, ease and confidence. |
| 2001-05-25 | Accurate and efficient c-v measurements Accurate and efficient c-v measurements |
| 2002-09-01 | Smart scope allows USB pre-compliance testing This technical article discusses how "smart oscilloscopes" with built-in measurements features can help ease pre-compliance USB signal testing time. |
| 2003-05-27 | Jitter analysis techniques using an Agilent Infiniium oscilloscope Jitter analysis techniques using an Agilent Infiniium oscilloscope |
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