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| 2009-04-28 | Sort test issues for emerging wireless designs Sort test issues for emerging wireless designs |
| 2008-10-03 | DigRF V4 test solution targets mobile handsets DigRF V4 test solution targets mobile handsets |
| 2008-06-20 | RF signal generator designed for comms test RF signal generator designed for comms test |
| 2007-09-14 | Instrument developers blend digital, RF test techniques Instrument developers blend digital, RF test techniques |
| 2006-10-03 | Tektronix unveils 'fastest' arbitrary waveform generator Tektronix, Inc. has announced its latest AWG7000 Series of Arbitrary Waveform Generators designed to meet the test needs for high-speed serial data buses and wideband digital RF devices. |
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