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| 2011-03-07 | Nano-imprint litho tool vendors optimistic Nano-imprint lithography has steadily made its mark in the IC domain as nano-imprint litho tool vendors achieve good defect density levels claiming that many tool platforms have shipped in the past year. |
| 2008-01-02 | Inline defect-review tool improves yield, time to market Inline defect-review tool improves yield, time to market |
| 2007-09-16 | Full-spectrum brightfield inspection uncovers IC defects Full-spectrum brightfield inspection uncovers IC defects |
| 2007-06-16 | Updating DFT strategies for nanometre designs As the industry races toward 90nm and 65nm nodes, a "complete" solution with advanced test patterns and fault models is needed to improve defect detection. |
| 2002-03-25 | IC failure analysis and defect inspection with scanning probe microscopy IC failure analysis and defect inspection with scanning probe microscopy |
| 2004-07-01 | Handling a storm of packaging defects The presence of internal packaging defects in IC packages can cause havoc with reliability; but acoustic micro imaging provides a way to control costs. |
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