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EE Times-India > Advanced Search > IEEE 1149.6

IEEE 1149.6 Search results

 
 
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2006-12-26 Tundra delivers silicon with LogicVision boundary scan
LogicVision Inc. has announced that Tundra Semiconductor Corp. has successfully delivered final silicon to customers, utilising LogicVision's boundary scan solution to support the IEEE 1149.6 standard.
2004-06-17 SCAN90CP02 design for test features
This app note shows several SCAN90CP02 designs for test features.
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