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| 2012-01-03 | Transactors test multi-protocol interface SoCs Transactors test multi-protocol interface SoCs |
| 2011-07-27 | Renesas adopts Wind River FAST s/w testing solution Wind River announces that Renesas Electronics selects Wind River FAST to test Renesas Electronics' Cortex-A9-based system-on-chip (SoC) platform for Android-based smartphones and consumer products. |
| 2010-11-09 | SoC design IP reduces soft error rates SoC design IP reduces soft error rates |
| 2010-08-02 | MediaTek chipset rules WiMAX benchmark tests MediaTek flaunts that its WiMAX SoC was almost consistently the top performing solution in an independent performance benchmark test of mobile WiMAX chipsets conducted by Signals Research Group LLC. |
| 2008-02-26 | Complex SoC testing with a core-based DFT technique Complex SoC testing with a core-based DFT technique |
| 2008-05-09 | ST, Mobileye test driver assistance ST, Mobileye test driver assistance |
| 2008-02-19 | Using power regression testing for SoC design Using power regression testing for SoC design |
| 2007-12-11 | Test solution lowers cost of SoC testing Test solution lowers cost of SoC testing |
| 2007-12-10 | Intel establishes new group to accelerate SoC shift Intel establishes new group to accelerate SoC shift |
| 2007-10-30 | Intel exec: Advanced test tools needed for next-gen SoC Intel exec: Advanced test tools needed for next-gen SoC |
| 2007-10-23 | 12GHz WSGA test solution for RF SoC devices debuts 12GHz WSGA test solution for RF SoC devices debuts |
| 2007-06-01 | Testing complex systems on chip Learn about the unique test challenges of SoCs, scan techniques, advanced fault models and test compression needed to keep pattern volume and test costs minimal. |
| 2005-12-16 | Unified methodology enables full-chip test Unified methodology enables full-chip test |
| 2005-09-13 | Indian researchers propose new SoC test method Indian researchers propose new SoC test method |
| 2000-12-01 | SoCs likely to pose heading-off test problems SoCs likely to pose heading-off test problems |
| 2001-03-01 | Embedded test complicates SoC realm Embedded test complicates SoC realm |
| 2002-03-01 | Functional verification of 10M-gate SoCs This technical article discusses the advantages of implementing the "white-box" design methodology for instrumenting RTL structures inside very large SoC designs as compared to the traditional black-box test suites. |
| 2002-04-01 | Self-repair boosts memory SoC yields Self-repair boosts memory SoC yields |
| 2002-04-16 | DFT confronts test cost in design run DFT confronts test cost in design run |
| 2002-07-01 | Universal controller ties fate to emulation SoC design service providers are tapping the flexibility of emulation techniques to enhance chip verification and test. |
| 2002-10-16 | Passing the SoC test with flying colors Passing the SoC test with flying colors |
| 2003-04-16 | DBIST answers advanced SoC test challenges DBIST answers advanced SoC test challenges |
| 2004-04-16 | Diagnostic test for design validation Diagnostic test for design validation |
| 2004-07-16 | Testing multibus system-on-chip devices Multiple-clock domain buses require |
| 2004-08-02 | A critical test of SoC memory strategies A critical test of SoC memory strategies |
| 2005-06-16 | SystemVerilog enhances assertion-based verification ABV leverages designer knowledge and automatic verification methods to stress-test the design before tape-out. Find out how |
| 2005-08-16 | DFT, DFM tests assure quality SoC design DFT, DFM tests assure quality SoC design |
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