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| 2011-04-15 | Facilitating at-speed test at RTL (Part 2 Facilitating at-speed test at RTL (Part 2 |
| 2011-04-11 | Facilitating at-speed test at RTL (Part 1 Facilitating at-speed test at RTL (Part 1 |
| 2010-07-14 | Memory test solution supports DDR3, DDR4 Memory test solution supports DDR3, DDR4 |
| 2008-12-15 | Test wireless devices for HSUPA compatibility Test wireless devices for HSUPA compatibility |
| 2006-10-30 | Test methods identify small delay defects Test methods identify small delay defects |
| 2008-02-28 | ADI launches lowest power voltage-feedback amp Analog Devices launches lowest power voltage-feedback amplifier that balances high speed, low noise and reduced distortion levels at less than half the power of competing amps for high-speed instrumentation and test equipment. |
| 2007-06-15 | Test systems speed semiconductor characterisation Test systems speed semiconductor characterisation |
| 2007-03-06 | Digital multi-meter offers 50,000 readings Agilent introduced its 1U LXI digital multi-meter, providing test system integrators with measurement speed and throughput of 50,000 readings per second at 4-1/2 digits accuracy. With its reduced 1U size, it is suitable for space-constrained applications including aerospace/defence depot test. |
| 2005-12-08 | Intellitech's new tech demo Intellitech demonstrates a technology for testing the gigabit Serdes connections of Xilinx FPGAs at their rated speed of up to 10Gbps in a multi-PCB system. |
| 2000-12-01 | SoCs likely to pose heading-off test problems SoCs likely to pose heading-off test problems |
| 2001-09-27 | USB2.0 and 1394: At-speed production testing of 480+Mbps transceivers USB2.0 and 1394: At-speed production testing of 480+Mbps transceivers |
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