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| 2011-10-14 | Cut yield fallout by preventing over and under at-speed testing Cut yield fallout by preventing over and under at-speed testing |
| 2011-04-15 | Facilitating at-speed test at RTL (Part 2 Facilitating at-speed test at RTL (Part 2 |
| 2011-04-11 | Facilitating at-speed test at RTL (Part 1 Facilitating at-speed test at RTL (Part 1 |
| 2006-10-30 | Test methods identify small delay defects Here's how to improve test quality without dramatically increasing the cost of test. |
| 2006-03-17 | Chip offers high-speed interfaces with ESD protection STMicroelectronics has introduced a device that allows high-speed interfaces such as DVI, HDMI, USB 2.0 and Ethernet to operate at speed of up to 3.2Gbps with full 15kV ESD protection. |
| 2005-12-08 | Intellitech's new tech demo Intellitech demonstrates a technology for testing the gigabit Serdes connections of Xilinx FPGAs at their rated speed of up to 10Gbps in a multi-PCB system. |
| 2000-12-01 | SoCs likely to pose heading-off test problems This technology news article describes the problems and solutions test engineers should face when confronting SoC designs. |
| 2001-09-27 | USB2.0 and 1394: At-speed production testing of 480+Mbps transceivers USB2.0 and 1394: At-speed production testing of 480+Mbps transceivers |
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