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| 2012-03-09 | Achieve flexibility through test code management Achieve flexibility through test code management |
| 2011-05-19 | Automated test system designed for MIL-STD 461 Automated test system designed for MIL-STD 461 |
| 2010-11-09 | SoC design IP reduces soft error rates Synopsys rolls out the DesignWare Self-Test and Repair Error Correcting Codes IP offering automated design implementation and test diagnostic flow to reduce the embedded memory transient errors. |
| 2009-04-02 | LDRA tool gets new version LDRA tool suite v8.0 is the first fully automated end-to-end solution for software verification support. |
| 2009-01-27 | Digital I/O device for automated handler machine Digital I/O device for automated handler machine |
| 2008-12-12 | Test system integrates curve tracer Test system integrates curve tracer |
| 2007-11-22 | Applied to acquire supplier of PV cell test system Applied to acquire supplier of PV cell test system |
| 2007-06-15 | Test systems speed semiconductor characterisation Test systems speed semiconductor characterisation |
| 2002-08-16 | Test systems move to the desktop Test systems move to the desktop |
| 2003-05-16 | Test system simulates and validates ECMs Test system simulates and validates ECMs |
| 2003-07-16 | Meeting ISO requirements for complex electronic test equipment Meeting ISO requirements for complex electronic test equipment |
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