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| 2010-07-20 | Shorten test time with package-based MBIST strategy Test time is a significant component of ASIC cost. It needs to be minimized and yet has to have maximum coverage to ensure zero-defect scenario for an automotive application. |
| 2010-07-05 | Protection of automotive electronics from electrical hazards, guidelines for design and component selection Protection of automotive electronics from electrical hazards, guidelines for design and component selection |
| 2010-06-01 | Protection of automotive electronics from electrical hazards, guidelines for design and component selection Protection of automotive electronics from electrical hazards, guidelines for design and component selection |
| 2007-04-26 | Automotive ICs combine LIN transceiver, voltage regulator Automotive ICs combine LIN transceiver, voltage regulator |
| 2005-02-01 | EMI immunity testing for automotive components EMI immunity testing for automotive components |
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