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| 2011-06-09 | PNA-X non-linear vector network analyser and X-parameters in power amp design PNA-X non-linear vector network analyser and X-parameters in power amp design |
| 2010-06-22 | Scope handles 50Mbit/s to 40Gbit/s signals Agilent's 86100D DCA-X oscilloscope offers high analogue bandwidth, low noise and low jitter measurements on signals from 50Mbit/s to over 40Gbit/s. |
| 2010-03-18 | IMEC, Altos to set up library re-characterisation service IMEC, Altos to set up library re-characterisation service |
| 2009-09-14 | 1kW dual stage DC-AC converter based on the STP160N75F3 The analysis, design and performance characterisation of a 1kW dual stage DC-AC converter, suitable for use in battery-powered UPS or photovoltaic (PV) stand-alone systems, are presented in this application note. |
| 2009-02-24 | Magma enhances SiliconSmart tool Magma has announced functional recognition capabilities in its SiliconSmartLibrary Characterisation and Modelling product line. |
| 2008-10-15 | System for automatic IC characterisation at DC level System for automatic IC characterisation at DC level |
| 2006-08-18 | The sub-100nm imperative: parametric yield ramp When targeting sub-100nm processes, designers must consider yield factors before they release a design for manufacture. |
| 2008-08-28 | RFIC design using Virtuoso Designer RFIC design using Virtuoso Designer |
| 2008-05-26 | Spice circuit simulator runs 5x-10x faster Legend Design Technology has improved its Spice circuit simulator for models used in cell library characterisation in SoC designs. |
| 2007-12-10 | DisplayPort solution for source and sink test debuts Agilent Technologies has expanded its DisplayPort test solution for design, characterisation and debug that enables engineers to speed up the devt cycle and time-to-market of new PC display designs. |
| 2007-05-25 | Tool addresses memory characterisation at 45nm Tool addresses memory characterisation at 45nm |
| 2007-05-15 | Test software publishes results to secure website VI Technology's Arendar 2007 version provide instant access to design, characterisation, validation and verification, and manufacturing test information across the enterprise. |
| 2006-10-03 | Agilent claims 'first' PSP model extraction The Pennsylvania State University-Philips (PSP) model parameter extraction package from Agilent Technologies Inc. provides more accurate and efficient modelling than was possible with previously available solutions. |
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