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2012-01-03	Transactors test multi-protocol interface SoCs Mentor's Veloce transactors allow engineers to stress-test a DUT that includes one or more protocol interfaces on their SoC at orders of magnitude faster than simulation.
2011-10-12	Modular instruments to touch Rs.5,000 crore According to Frost & Sullivan, modular instruments revenue estimates to reach to Rs.5,246.64 crore ($1.17 billion) in 2017 due to the benefits of modular instruments over traditional instruments.
2010-02-24	Reconfigurable compact test sytem suits any DUT Reconfigurable compact test sytem suits any DUT
2006-12-20	eInfochips releases AMBA AHB verification component eInfochips, Inc. has announced the availability of AMBA AHB Verification component for the Mentor Graphics Questa Vanguard program. AMBA AHB verification IP provides building blocks for efficient DUT for module and system-level verification, including comprehensive assertion testing.
2005-12-19	Measuring progress facilitates verification coverage You must ensure that progress problems are observed and corrected early in verification with an efficient coverage plan.
2000-12-01	The advantage of using logic BIST for ASIC designs This technical paper reveals the advantage of using logic BIST for ASIC designs.
2001-03-01	Advances in acoustic microscopy This article discusses some of the advancements in acoustic microscopy, which provide users new tools useful for difficult design analysis.
2001-08-01	Ensuring signal integrity in microprocessors and memory TDR and frequency domain analysis can solve design problems regarding reflections, crosstalk and signal losses in memory systems.
2001-08-01	Getting a grip on Bluetooth testing The authors show how engineers can test their products in accordance with the standard tests developed by the Bluetooth Special Interest Group (SIG).
2001-12-01	TDR for characterization and modeling, Part 1 This article is the first of two parts. Here, the author discusses the time domain reflectometry modeling. This modeling technique allows designers to obtain both lumped as well as distributed SPICE and IBIS models for package interconnect that will correlate to the physical layout of the package.
2002-05-02	What is your measurement accuracy? This application note describes a Windows-based program that enables the VNA user to estimate the "uncertainty" for conditions associated with a specific measurement making users meet the analysis requirements of the ISO standards.
2002-05-10	Harmonics measurements This application note discusses the measurement of a device's harmonics on a MS462xx tool over a possibly large dynamic range with a number of options.
2002-05-10	Intermodulation Distortion: Scorpion Option 13 This application note discusses methods to successfully measure two-tone intermodulation distortion (IMD) products using the IMD option of the MS462xx Vector Network Measurement System.
2002-05-10	NF accuracy: Scorpion Option 4 This application note describe Anritsu's MS362X Scorpion Vector Network Measurement system and how it provides six ways to measure noise figure.
2002-05-10	Noise figure: Scorpion Option 4 This application note provides information on performing and understanding vector error-corrected noise figure measurements using the MS462xx.
2002-05-14	Time Domain for vector network analyzers This application note illustrates the capabilities of vector network analyzers and the Time Domain function.
2002-10-10	Amplifier research products that provide 100V/m CW or PM at a distance of 1m This application note discusses the scenario of how Amplifier Research products provide 100V/m CW or PM at a distance of 1m.
2002-10-10	Products that provide 200V/m CW or PM at a distance of 1m This application note discusses the scenario of how products provide 200V/m CW or PM at a distance of 1m.
2002-10-10	Amplifier research products that provide 10V/m CW or PM at a 1m distance This application note discusses the scenario of how Amplifier Research products provide 10V/m CW or PM at a distance of 1m.
2002-10-10	T/R switch for IMT-2000 handset applications This application note describes a handset T/R switch design that enables its antenna to be electronically connected to either the transmitter or receiver.
2002-10-10	Amplifier research products that provide 50V/m CW or PM at a distance of 1m This application note discusses the scenario of how products provide 50V/m CW or PM at a distance of 1m.
2002-10-10	Amplifier research products that provide 5V/m CW or PM at a distance of 1m This application note discusses the scenario of how products provide 5V/m CW or PM at a distance of 1m.
2002-10-10	Amplifier research products that provide 20V/m CW or PM at a distance of 1m This application note discusses the scenario of how Amplifier Research products provide 20V/m CW or PM at a distance of 1m.
2002-12-18	Amplifier research products that provide 100V/m CW or PM at a distance of 1 meter This article describes amplifier research products that provide 100V/m CW or PM at a distance of 1 meter.
2002-12-18	Amplifier research products that provide 10V/m CW PM at a distance of 1 meter This application note describes amplifier research products that provide 10V/m CW or PM at a distance of 1 meter.
2002-12-18	Products that provide 200 V/m cw or pm at a distance of 1 meter This article provides information on products that provide 200 V/m cw or pm at a distance of 1 meter.
2003-01-16	Ethernet-enabled AC detector test system This article discusses hot to setup an Ethernet-enabled AC test system that can share a mobile test system between PC test stations.
2003-03-18	Meeting the challenge of fast, cost-effective OLED testing OLED electrical characteristics differ significantly from inorganic semiconductor-based emitters, which verifies the importance of conducting tests that would yield accurate performance results.
2003-05-02	Direct impedance method for load resonant measurement The paper addresses how and why the direct impedance method is better than the other measurement methods such as the physical load capacitor method.
2003-05-27	NPR - noise power ratio signal generation and measurement This application note describes Noise Power Ratio (NPR), an add-on tool for WinIQSim to generate noise power ratio stimulus signals and measure the resulting noise power ratio of a device under test (DUT) using Rohde & Schwarz instruments via the IEC/IEEE bus.

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