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| 2007-05-21 | Measuring scan compression performance Know the three fundamental performance metrics: fault coverage loss, pattern inflation, and area overhead. |
| 2007-10-25 | India researchers propose new layout-aware design Indian researchers have proposed a layout-aware design of the ILS architecture that provides a compromise between fault coverage, test app time/test data volume and wiring cost. |
| 2001-01-01 | Test coverage enhancements at the register transfer level Test coverage enhancements at the register transfer level |
| 2001-12-16 | Overcoming in-circuit testability problems This technical article describes the common testability problems encountered with in-circuit designs and the basic requirements needed to solve them. |
| 2002-04-16 | DFT confronts test cost in design run This technical article offers a synopsis of the challenges in SoC design, particularly with regard to test costs. |
| 2002-06-12 | CL10K NoFault testing This application note describes how Clear Logic's NoFault test method provides 100-percent stuck-at fault coverage, without the need for customer design or test support. |
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