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| 2011-06-14 | Qualcomm to buy Rapid Bridge, gain IC tech innovation Qualcomm to buy Rapid Bridge, gain IC tech innovation |
| 2009-11-26 | Testing RF ICs with DigRF interconnects Testing RF ICs with DigRF interconnects |
| 2008-10-01 | Fine-tuning RF platform shrinks design time An RF development platform capable of carrying out most of the pre-regulatory tests enables OEMs to put together a solid, well-planned compliance testing plan. |
| 2008-05-13 | ASE closes ASE Test buyout soon ASE expects to complete its acquisition of ASE Test by May 30. |
| 2003-12-01 | How to automate stress tests The goal of stress testing is to find system-level interaction problems. Here's a strategy for developing a successful stress-test framework. |
| 2007-12-07 | ON Semi sets up 2nd IC protection test lab in China ON Semi sets up 2nd IC protection test lab in China |
| 2007-03-09 | Samsung recalls SD cards, cites defective controller IC as cause Samsung recalls SD cards, cites defective controller IC as cause |
| 2007-01-22 | China testing, packaging industry lacks potential, says UTAC China testing, packaging industry lacks potential, says UTAC |
| 2007-01-16 | Hong Kong S&T Park tackles China RoHS The industry is again bracing itself for another, reportedly tougher, environmental regulation—China's Administration on the Control of Pollution Caused by Electronic Information Products. |
| 2007-01-03 | Back-end memory testing might tighten in 2007 Back-end memory testing might tighten in 2007 |
| 2006-11-29 | Optimal test software suite maximises IC yields Optimal test software suite maximises IC yields |
| 2006-05-23 | IC Design House Survey 2006: South Korea IC Design House Survey 2006: South Korea |
| 2006-05-23 | IC Design House Survey 2006: Taiwan IC Design House Survey 2006: Taiwan |
| 2006-05-23 | IC Design House Survey 2006: China IC Design House Survey 2006: China |
| 2006-05-03 | IC design companies press for lower testing services quotes IC design companies press for lower testing services quotes |
| 2005-10-25 | O2Micro to open China facility O2Micro International Ltd has announced plans to set up an IC test facility in China. The testing center, which will be ready by 2006, will perform final electrical and wafer level electrical testing for analog and mixed signal products. |
| 2000-11-27 | Oscilloscope probing of PC133/Rambus circuits This application note demonstrates several probing techniques for PC133/Rambus high-speed digital circuits, with an objective of acquiring a highly accurate signal waveform. |
| 2001-03-01 | Embedded test complicates SoC realm SoC devices today implement a variety of specialized microelectronic functions. Those functions, sometimes with embedded systems, typically comprise of hardware or software design objects. |
| 2001-04-06 | Testing and specifying FAST logic Testing and specifying FAST logic |
| 2001-04-15 | New thinking needed amid runaway test costs There is a need to achieve test-cost reductions that rival the reductions in wafer fabrication costs to ensure continued growth of semiconductor markets. ATE should not wait for someone else to do it. |
| 2001-04-23 | Using NAND tree test circuits for input parametric testing Using NAND tree test circuits for input parametric testing |
| 2001-04-23 | Guidelines for supplying test vector simulations This application note provides the necessary information to ensure that the vectors generated from the functional verification and testing of an ASIC will fit within AMI's standard test format. |
| 2001-06-16 | Taiwan's design foundries thriving despite downturn A design house merely designs an IC; a design foundry provides total solutions from embedded IPs to complex tasks of time-to-market SoC design, production and testing services. |
| 2002-02-01 | Effective testing for Bluetooth transceiver ICs Effective testing for Bluetooth transceiver ICs |
| 2002-06-12 | CL10K NoFault testing CL10K NoFault testing |
| 2002-06-20 | TAB tape carrier with micro plating bumps for burn-in testing socket TAB tape carrier with micro plating bumps for burn-in testing socket |
| 2002-10-11 | ispPAC 80/81 Evaluation Board ispPAC80EV-2A This application note discusses how the ispPAC80/81 In-System-Programmable Analog Circuit allows designers to build analog circuits without the use of external feedback resistors or capacitors. |
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