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| 2009-09-02 | Monitors enable 3Gbps SDI eye pattern display The new Tektronix waveform monitors offer 3Gbps SDI support, precise colour grading adjustments. |
| 2009-08-14 | Assess power-supply noise rejection in low-jitter PLL clock generators Assess power-supply noise rejection in low-jitter PLL clock generators |
| 2008-07-11 | Analysing jitter using a spectrum approach Analysing jitter using a spectrum approach |
| 2008-04-07 | Tektronix upgrades its WFM & WVR series Tektronix Inc. has upgraded its WFM and WVR series of waveform monitors and rasterizers including the addition of 3Gbit/s Single Link SDI support to the WFM7020 and WFM7120 waveform monitors. |
| 2007-10-04 | 10Gbps telecom jitter solution tests device compliance 10Gbps telecom jitter solution tests device compliance |
| 2001-04-01 | Fast testing techniques for OC-192 Despite a lack of measurement standards, a few testing techniques are available to minimize jitter problems in high-speed optical communications. |
| 2001-04-01 | Fast testing techniques for OC-192 Despite a lack of measurement standards, a few testing techniques are available to minimize jitter problems in high-speed optical communications. |
| 2001-04-24 | Jitter specifications made easy: A heuristic discussion of Fibre Channel and Gigabit Ethernet methods Jitter specifications made easy: A heuristic discussion of Fibre Channel and Gigabit Ethernet methods |
| 2002-06-12 | RMS jitter calculation in the 12kHz to 20MHz bandwidth for VI's CO-600V series VCXO RMS jitter calculation in the 12kHz to 20MHz bandwidth for VI's CO-600V series VCXO |
| 2003-03-17 | Measuring deterministic jitter using a scope Measuring deterministic jitter using a scope |
| 2004-09-01 | Isolating BER bursting in high-precision measurements This article demonstrates how to use adjacent cycle-to-cycle waveform analysis to enhance one's ability to identify rare events to their root cause. |
| 2004-12-01 | A standardized procedure for the direct measurement of sub-picosecond RMS jitter in high-speed analog-to-digital converters A standardized procedure for the direct measurement of sub-picosecond RMS jitter in high-speed analog-to-digital converters |
| 2005-01-17 | Learn the DTA equation The accuracy of the DTA equation relies on several factors: sample rate, measurement time and oscilloscope front-end. |
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