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| 2012-02-28 | IBM 'clicks' electric charge in single molecule IBM scientists could manage to see an image of the electric charge distributed within a single molecule. |
| 2011-12-27 | Analogue switch replaces relays in ultrasounds The 32-channel high-voltage Supertex HV2808 analogue switch IC targets medical ultrasound imaging systems, in which it would replace the electromechanical relays performing the probe selection function. |
| 2011-10-12 | Multi-contact probe tests 30µm x 50µm pads Multi-contact probe tests 30µm x 50µm pads |
| 2011-09-20 | Use wide-bandwidth sampling scope to probe high-speed signal Use wide-bandwidth sampling scope to probe high-speed signal |
| 2011-06-02 | Optimising oscilloscope measurement accuracy on systems with Agilent active probes Know the considerations when selecting an oscilloscope probe to capture high-speed signals. |
| 2011-03-16 | 3D, multi-probe testing solutions unveiled 3D, multi-probe testing solutions unveiled |
| 2011-02-24 | OTA test methods for evaluating the performance of MIMO user equipment Learn abouut the three predominant OTA test methods including the two-stage OTA method, the multiple test probe OTA method and the reverberation chamber method. |
| 2010-12-13 | Mixed-signal oscilloscope series addresses low price gap Tektronix has extended its oscilloscope offerings with a mixed-signal oscilloscope series of high-bandwidth and low capacitance passive voltage probes starting at Rs.509,239.48 ($11,400). |
| 2010-11-24 | IMEC partners with FP6 on neural probe tech IMEC partners with FP6 on neural probe tech |
| 2010-11-09 | Current probes improve measurement flexibility Fluke Corp. debuts the iFlex flexible current probes that improve measurement flexibility and offer expansion in the measurement range of select Fluke clamp meters to 2500A AC. |
| 2010-11-03 | Hardware kit offers 64ch ultrasound FE platform Samplify Systems releases the SMK9130 ultrasound beamforming development kit that offers a complete hardware solution for the ultrasound front end, from probe connector to PCIe connector. |
| 2010-09-29 | IBM perfects pulsed-STM technique for single-atom bit-cells Physicists at the IBM Almaden Research Centre perfected a new pump-probe pulsed-STM technique that may pave the way to enabling single-atom bit-cells for memory ICs. |
| 2010-09-22 | Li-ion batteries go under the microscope ORNL researchers have devised a new type of scanning probe microscopy called electrochemical strain microscopy (ESM) to learn how lithium ions move through a battery's cathode material. |
| 2010-08-16 | GDDR5 compliance test tools target oscilloscopes Agilent unveils the graphics double data rate 5 (GDDR5) compliance test application packages and GDDR5 ball-grid array (BGA) probes for oscilloscopes. |
| 2010-08-12 | Pb-free solder paste features probe testability Pb-free solder paste features probe testability |
| 2010-03-17 | FormFactor opens wafer probe card facility FormFactor opens wafer probe card facility |
| 2010-01-05 | South Korea closes NAND antitrust case South Korea's Fair Trade Commission has closed a three-year investigation of NAND flash memory chipmakers, absolving chip makers of international price fixing. |
| 2009-12-04 | Memory test solution achieves up to 800Mbps The Magnum 2x test solution is capable of testing over 1280 devices in parallel. |
| 2009-09-28 | Inexpensive (almost free) probe/tweezers for testing SMD components Inexpensive (almost free) probe/tweezers for testing SMD components |
| 2009-09-14 | EC panel to dig into Qualcomm patent case European Commission antitrust regulators are considering setting up a special panel to unravel the long-drawn out case pending against Qualcomm Inc. concerning patent royalty payments. |
| 2009-06-30 | Probe, calibrate for accurate BBIQ measurements Probe, calibrate for accurate BBIQ measurements |
| 2009-06-02 | LPDDR BGA probe for scopes, logic analysers debuts LPDDR BGA probe for scopes, logic analysers debuts |
| 2009-05-06 | Sensor to probe deep into the 'Big Bang Sensor to probe deep into the 'Big Bang |
| 2009-04-24 | IMEC touts deep-brain stimulation probe IMEC touts deep-brain stimulation probe |
| 2009-03-23 | Measuring power supply ripple Read about the mistakes an engineer made when he measured power supply ripple, and the solutions to those errors. |
| 2009-01-19 | High node count fixturing for test fixtures Know the problems in building large, high node count vacuum actuated test fixtures for In-circuit board test systems. |
| 2009-01-15 | Agilent, Hynix develops long-wire ZIF tip The high-performance long-wire ZIF probe tip is optimised for DDR and GDDR SDRAM validation. |
| 2009-01-07 | Logic analysis solution for HT3 debuts Agilent and Astek have introduced the first logic analysis solution for HT3 using an interposer probe. |
| 2008-10-08 | Wind River Probe: a USB connectivity solution Wind River Probe: a USB connectivity solution |
| 2008-10-03 | Micromint, IAR partner for industrial SBC Micromint selected IAR as its tools partner for its latest computer board targeted at the industrial market. |
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