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| 2008-12-15 | IC test: Get more for less Read about test compression techniques that allow adding of new tests while using less tester memory space and test time. |
| 2008-02-26 | Complex SoC testing with a core-based DFT technique Know how to overcome the challenges of high power consumption and huge data volume generated during testing. |
| 2007-05-21 | Measuring scan compression performance Measuring scan compression performance |
| 2007-10-08 | Xpress tech provides compression levels exceeding 100X Xpress tech provides compression levels exceeding 100X |
| 2007-06-01 | Testing complex systems on chip Learn about the unique test challenges of SoCs, scan techniques, advanced fault models and test compression needed to keep pattern volume and test costs minimal. |
| 2006-11-24 | Sanyo adopts DFT MAX to improve test quality Synopsys Inc. has announced that Sanyo Semiconductor Co. Ltd has adopted the Synopsys DFT MAX scan compression automation solution to further increase the test quality of its digital designs. |
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