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EE Times India - total search 9 articles sort by date sort by relevance
TI backs ratification of IEEE 1149.7 standard 2008-09-04
Texas Instruments has announced that it is driving the ratification of the IEEE 1149.7 standard  
Three firms launch RTOS-based platform 2008-09-02
IAR Systems, NXP, and Micrium have announced the launch of a new reference design platform.  
Users present latest apps in JTAG user days 2008-06-11
Over 50 users of JTAG Technologies' boundary-scan tools attended the 2008 JTAG Technologies User Days  
Embedded designers face changes in debug tools 2007-10-01
There has been a good deal of standardisation in both, software-based and hardware-centric.forms of debugging needed for embedded systems.  
Multi-core pushes RTOS, tool revisions 2007-05-17
RTOS and tool providers are improving model-driven design, virtual prototyping and C-language compilation to spur multi-core programming and debugging.  
Tundra delivers silicon with LogicVision boundary scan 2006-12-26
LogicVision Inc. has announced that Tundra Semiconductor Corp. has successfully delivered final silicon to customers, utilising LogicVision's boundary scan solution to support the IEEE 1149.6 standard.  
Altera FPGAs power XtremeData system 2006-06-08
Altera Corp. has announced that XtremeData has chosen Altera's Stratix II FPGA device for their XD1000 FPGA co-processing solution.  
Intellitech's new tech demo 2005-12-08
Intellitech demonstrates a technology for testing the gigabit Serdes connections of Xilinx FPGAs at their rated speed of up to 10Gbps in a multi-PCB system.  
Integrate flash device programming, reduce cost 2005-11-01
Flash memory devices offer high density and low cost to engineers who seek devices that are easy to program and erase.  

Embedded Design India - total search 34 articles
Simplified programming of Altera FPGAs using a SCANSTA111/112 JTAG scan chain mux 2009-12-30
Using multiple boundary scan port linker (BSCAN2) 2009-10-28
MSC81xx and MSC711x JTAG connectivity 2009-09-02
Automatically initializing data segment values in MAX-IDE 2009-08-19
LatticeXP2 security usage guide 2009-07-02
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Power Design India - total search 8 articles
Debugging MSP430 LPM4.5 2010-02-01
Powering up and programming the ProcessorPM ispPAC-POWR605 2010-01-22
ispPAC-POWR1208P1 evaluation board PAC-POWR1208P1-EV 2009-09-22
Configure the ispPAC-POWR1220AT8 device 2009-07-02
In-circuit programming of EEPROM-based system monitors 2009-01-29
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EE Times Asia - total search 338 articles
Hardware tool handles multicore debugging 2010-03-18
Sequencers/monitors integrate fault registers 2010-03-15
Graphics controller comes with complete tool-chain 2010-03-08
Customizing the Freescale Advanced Toolkit for i.MX-based platforms 2010-02-24
IEEE releases 1149.7 on-chip test standard 2010-02-12
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