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EE Times India - total search 169 articles sort by date sort by relevance
Technical intro to functional qualification, Part 2 2009-04-08
Read about functional qualification and how it is related to mutation analysis.  
Increase visibility in FPGA prototypes and emulators 2006-03-07
The article suggests visibility enhancement techniques for FPGA prototypes and emulators that help locate, isolate and understand the causes of error symptoms.  
Pushing power forward with a common power format 2006-11-05
The invention of a complete and consistent Common Power Format presents an industry-wide solution to the complicated deployment of low-power design techniques.  
Integrating Power Awareness into IC Design 2007-03-01
A single-file common power format (CPF), by including and supporting advanced low-power techniques, can help insure that the more efficient IC designs are also producing more power-efficient IC end products.  
Biometrics systems now recognize multiple traits 2001-06-01
Many companies are turning to biometrics to truly recognize authorized users through unique, non-transferable and non-duplicatable traits, such as a face, voice or fingerprint.  
Embedded test complicates SoC realm 2001-03-01
SoC devices today implement a variety of specialized microelectronic functions. Those functions, sometimes with embedded systems, typically comprise of hardware or software design objects.  
Abstraction for control-dominated designs 2009-02-12
Here's an article that disproves the idea that abstractions in ESL design are not applicable to a large subset of designs.  
Questions for SystemC 2001-05-16
OSCI is supposed to be an "open" and independent standards effort, but Synopsys still has total control over the license agreement.  
Polar modulation in mobile PA design 2004-02-02
POWER  
Mobile devices' new roles need new tools 2004-01-01
Mobile devices' new roles need new tools  
Optical beats copper in Infiniband tests 2008-07-01
A new range of high-performance optical interconnect cables designed to enable computing clusters to scale out substantially further than existing 24AWG copper cables has recently become available. This article looks at the test configuration for a new Infiniband optical cable from Intel.  
Design patterns for high availability 2002-08-02
It is possible to achieve five-nines reliability with everyday commercial-quality hardware and software. The key is the way in which these components are combined.  
An introduction to model checking 2005-02-16
An introduction to model checking  
Fingerprint identification technology set for use 2003-04-01
Fingerprint identification technology set for use  
Improve system design testing processes with CMMI 2009-09-24
Requirements-based testing is widely viewed as a best practice according to corporate standards such as the Capability Maturity Model Integration (CMMI).  


 
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