February 16-29 issue
This issue of EE Times-India's Community Newsletter focuses on test and measurement.
 
 

Download your FREE copy now to read about the latest trends in testing technology. Learn how new technologies, such as PCI Express and multi-core processors, are driving the trend towards virtual instrumentation.
In Focus section brings you information on using oscilloscopes to capture multiple events for effective analysis and optimizing the use of memory by storing and displaying only the necessary data.


Top Story
EDA tools add TM for complex designs
The pressures to move swiftly from the design phase to hardware realisation are at the core of accelerating every product development cycle. Poised to revolutionise RF circuit design is the ability to integrate test equipment with a design automation tool. This ability makes it possible to do things such as directly correlate simulation and prototype data, create virtual hardware, simulate difficult to reproduce hardware impairments and extend test equipment capabilities..." read on.

Also in this issue
Trends
Virtual instrumentation provides greater flexibility
 
In Focus
New tech advances drive virtual test
Segmented memory improves DAQ
 
Community
VLSI trends: Scaling CMOS to its limit
Upcoming events from February to April
 

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