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Power/Alternative Energy  

A standardized procedure for the direct measurement of sub-picosecond RMS jitter in high-speed analog-to-digital converters.

Posted: 01 Dec 2004  Print Version  Bookmark and Share Subscribe

Keywords: texas instruments  analog-to-digital converters  adcs 

[Summary of tips] This app note proposes an innovative, reliable characterization technique that allows to measure ultra-low jitter levels while also discriminating noise contributions due to jitter from other phenomena (voltage reference and substrate noise, high-amplitude distortion) in ADCs.View the PDF document for more information.
 
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