Amplifiers/Converters  

Structural system test via IEEE Std. 1149.1 with hierarchical and multi-drop addressable JTAG Port, SCANPSC110F

Win an iPad from EE Times-India!

And we think you're smart enough to win it. The engineer who creates the biggest discussion on eeForums wins the iPad. State your opinion, ask a question; it's your choice—just keep your comments interesting. Oh, and yes, industry-specific please. From there on in, your success is measured by every view and reply. The discussion that creates the biggest buzz by January 31 gets the prize. Joining instructions: (If you are already a member of EE Times-India, skip to step 3) 1. First, register as a member of EE Times-Asia at http://www.eetasia.com/register.do. 2. Verify your membership by clicking on the automated registration message sent to you. 3. Log-on to EE Times-India at http://www.eetasia.com/login.do. 4. Post a message on any of the categories at http://forum.eetindia.co.in Point system: Each message view gets one (1) point while each valid reply gets four (4) points. In case of a tie, the editors will choose the winner based on a review of the message and replies. Contest duration: December 21, 2010 to January 31, 2011. ...win the iPad now