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T&M  

New thinking needed amid runaway test costs

Posted: 15 Apr 2001  Print Version  Bookmark and Share Subscribe

Keywords: ate  automated test equipment  test costs  ic testing 

[Summary of tips] The ATE industry must find ways to use machine intelligence to reduce both the cost of verifying the system quality and the time required to bring products to market, says Bill Bottoms. BROKEN_PICTURE_ HIDDEN_END -->Bill Bottoms, founder of Third Millennium Test SolutionsThe IC industry affects almost every segment of the world......
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