Global Sources
EE Times-India
 
EE Times-India > Processors/DSPs
 
 
Processors/DSPs  

Test coverage enhancements at the register transfer level

Posted: 01 Jan 2001  Print Version  Bookmark and Share Subscribe

Keywords: flash  microcontroller  mpc555  powerpc  ssaf 

[Summary of tips] This technology article describes the RTL buffer insertion and fault grading that helps identify untested functions and low-fault coverage areas where added test vectors can be generated.View the PDF document for more information.
 

Comment on "Test coverage enhancements at the re..."
Comments:  
*  You can enter [0] more charecters.
*Verify code:
 
Highly Recommended Application Notes

Max's Cool Beans

Clive Maxfield Strange modes of transport and other "stuff"

Someone just pointed me at a YouTube video that claims to show the world's first e-powered multicopter flight...

 

Go to top             Connect on Facebook      Follow us on Twitter      Follow us on Orkut