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Technique probes deep-submicron test

Posted: 01 Dec 2000  Print Version  Bookmark and Share Subscribe

Keywords: iddq test  test vector  circuit defects tester 

[Summary of tips] BROKEN_TABLE_ HIDDEN_END -->The IDDQ testing method is one in which the steady-state, or quiescent (Q) value of the power supply current (IDD) is measured, and deviations from expected values indicate the presence of defects. IDDQ measurements are usually made by stepping the circuit through many functional or scan-based input......
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