Industry tackles approach to DFM, DFY issues
Keywords: DFM DFY at 65nm DFM DFY issues approaches Design Automation and Test in Europe
[Summary of tips] As design-for-manufacturing (DFM) and design-for-yield (DFY) take on critical importance at the 65nm node, discussions proceed apace about how best to handle them. At the last Design Automation and Test in Europe conference, experts from chip, EDA and foundry companies used a medical metaphor to frame the debate, asking whether......|
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