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Processors/DSPs  

Testing and debugging DSP systems (2)

Posted: 01 Mar 2007  Print Version  Bookmark and Share Subscribe

Keywords: IEEE 1149.1  boundary-scan technology  JTAG port  debugging 

[Summary of tips] One of the disadvantages of shrinking technology is that testing small devices effectively gets exponentially more complex. Such devices need custom testing, which can be expensive and inefficient. Also, much of the testing cannot be performed until the design is complete.Boundary-scan technology, however, allows extensive debu......
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