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Complex SoC testing with a core-based DFT technique
Keywords: core-based test automatic test pattern generation scan compression
[Summary of tips] Power consumption during test have grown dramatically with scaling technology and increasing design sizes. It is almost impossible to test a design once it reaches manufacturing. A core-based test strategy combined with scan compression is an effective way to limit power consumption of complex SoC tests.Traditional scan-based t......Please login or register with us to view this article>>
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