IMEC sends DFM tool for embedded SRAMs to Samsung
Keywords: EDA tool embedded SRAM process variations design-for-manufacturing
[Summary of tips] IMEC announced that it has successfully transferred the first EDA tool for statistical memory analysis to Samsung Electronics. The Memory Variability Aware Modelling (MemoryVAM) predicts yield loss of SRAMs caused by the process variations of deep-sub-micron IC technologies.IMEC's MemoryVAM is an essential tool to avoid already......|
Already registered? Login to view complete content.
|
| Related Articles | Editor's Choice |
Strange modes of transport and other "stuff"
Someone just pointed me at a YouTube video that claims to show the world's first e-powered multicopter flight...




















