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Understand JTAG's role in system debug
Keywords: Joint Test Action Group serial scan I/O
[Summary of tips] The Joint Test Action Group (JTAG) began solving board-level test problems in the 1990's by standardising a serial scan chain method (JTAG; IEEE 1149.1) for accessing on-chip resources and additional shift registers built into the I/O paths of every IC for boundary scan testing. Before the emergence of boundary scan testing, de......Please login or register with us to view this article>>
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