T&M 
Target small delay defects with ATPG
Keywords: ATPG small delay defects test challenges
[Summary of tips] In the nanometer technology era, as the designs going further below 65nm, maintaining quality of test is a big concern in the test community. Test engineers are facing new test challenges at lower geometries and the small delay defects are one of them which pose a serious concern for maintaining good DPM levels.The lower techno......Please login or register with us to view this article>>
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