EDA/IP 
Hurdling the issues of IC reliability
Keywords:IC reliability CMOS processes IC industrial issues
[Summary of tips] Advanced short-geometry CMOS processes are subject to ageing that causes major reliability issues, degrading the performance of ICs over time. Two of the most problematic effects causing ageing are hot carrier injection (HCI) and negative bias temperature instability (NBTI). Below 90nm, consideration of the effects of HCI and N......Please login or register with us to view this article>>
|
Not a registered user?
Register FREE to view unlimited features, tutorials and products, and enable any content alert service!
 |
Already registered? Login to view complete content.
|
| Related Articles | Editor's Choice |
Comment on "Hurdling the issues of IC reliabilit..."
Visitor(To avoid code verification, simply login or register with us. It is fast and free!)
|
||||||||||||||
|
||||||||||||||
 |
Top Ranked Articles
Most Popular Articles
Search EE Times India
