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Layout-aware DFT improves yield
Keywords: DFT design for test layout yield
[Summary of tips] Design for test (DFT) has come a long way in testing the validity of the designed hardware. The growing gate counts with complex SoC architectures and nanometre scaling has exploded test data volume, multiple test methods and also increased test application time. The exploding test data volumes do not ensure the corresponding t......Please login or register with us to view this article>>
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