T&M 
Shorten test time with package-based MBIST strategy
Keywords: test time MBIST strategy ASIC test
[Summary of tips] Test time is a significant component of ASIC cost. It needs to be minimized and yet has to have maximum coverage to ensure zero-defect scenario for an automotive application.Test mode usually accompanies memory built-in self test (MBIST) mode, which goes through all the bit-cells for all memory banks in a design. Depending on t......Please login or register with us to view this article>>
|
Not a registered user?
Register FREE to view unlimited features, tutorials and products, and enable any content alert service!
 |
Already registered? Login to view complete content.
|
Comment on "Shorten test time with package-based..."
Visitor0207
(To avoid code verification, simply login or register with us. It is fast and free!)
|
||||||||||||||
|
||||||||||||||
 |
Top Ranked Articles
Most Popular Articles
Search EE Times India
Max's Cool Beans
Strange modes of transport and other "stuff"
Someone just pointed me at a YouTube video that claims to show the world's first e-powered multicopter flight...
