Home | Login | Register Now [Mar 21,2010]

EDA |Embedded |Signals |Interface |Wireless |Network |Buffer/Storage |Power Design |Optoelectronics |Test |Manufacturing

For Registered Users

Reusing vital verification knowledge with OVM
Author: Jana Richards, Dan Cohen

Reuse of legacy-directed test environments is common practice. But with each generation of reuse, the number of tests grows and with it the overhead of maintaining the environment across multiple projects.

Please login or register with us to view this article>>

Not a registered user?

Email address:
Password:
Confirm password:
User name :	First name Last name
Company name:
Mobile number:
Job function:
Products/Services:
Country/Area:	India Other Country/Area

Already registered? Login to view complete content.

Email address:
Password:
	Password is case-sensitive.
	Remember password Forgot your password?

	If you have already registered on the following websites, please log in using your email address and password
EE Times-India sites: EE Times-Asia EE Times-Taiwan EE Times-Korea EE Times-China Analog/Mix signal Power Systems Embedded Design India Power Design India Home Entertainment Handheld Device Industrial Controls Auto Electronics

If you have already registered on the following websites, please log in using your email address and password

EE Times-India sites:

Embedded Design

• China's DTV standard revolutionises broadcast
• Using LTE on FPGAs
• PCIe multicast: Purposes, advantages
• Filter banks: Optimisation, synthesis
• Trends in open source for consumer electronics

more...

Power Design

• Build an intelligent solar tracking system with FPGAs
• "Pump and dump" with a capacitor bank
• Prevent hacking, tampering in energy meters
• Efficiently driving LEDs offline
• Micro-stepping eases step motors' operations

more...

Go to top

Connect on Facebook

eMedia Asia	Embedded Design India\|Power Design - India\|EE Times - Asia\|\|\|\|IIC-China
Global Sources	\|\|\|Electronic Components\|Computer Products\|Trade Show Center
TechInsights	EE Times\|ESM Online\|EE Times JAPAN

Copyright © 2010 eMedia Asia Ltd. All rights reserved. Reproduction in whole or in part in any form or medium without the express written permission of eMedia Asia Ltd. is prohibited. Warning: The images on this site are protected by digital watermark technology. Your use of this website is subject to, and constitutes acknowledgement and acceptance of our Terms of Use.