Smiths Interconnect’s Joule 20 test socket provides first-class electrical and mechanical performance in testing peripheral ICs.
Smiths Interconnect’s Joule 20 test socket features failsafe scrubbing contact technology that provides first-class electrical and mechanical performance in testing peripheral ICs for the most demanding communication, consumer, wearable and automotive applications.
Its innovative design allows for the housing to be disassembled without removing the socket from the PCB. This enables cleaning and repair to be done without taking production equipment offline, reducing equipment down-time and improving production throughput.
“The recent acceleration of the digital age is creating a huge demand for new consumer/commercial electronics, as well as for self-driving vehicles. Integrated circuits become faster and more complex, which requires high test reliability and reduced test time,” said Bruce Valentine, Vice President and General Manager of the Semiconductor Test Business Unit at Smiths Interconnect. “As IC technology evolves to meet these demands, Smiths Interconnect stands ready to support with solutions like Joule, which provides increased throughput as well as faster, reliable, and repeatable testing of Peripheral Packages (QFN, QFP, and SOIC).”
Smiths Interconnect’s Joule 20 test socket offers significant differentiating benefits including: