Nine Experts – All About Electronic Design and Test

Article By : Rohde & Schwarz

Watch industry speakers from Picotest, EyeKnowHow, Texas Instruments and Rohde & Schwarz share key challenges and methodology in electronic design and test solution.

Unlike those days, the electronic circuit today shrinks in size, but its CPU, DDR memories and FPGAs on circuit boards continues to drive for higher performance, higher speed, higher level of integration and lower power consumption. Realizing the challenges the electronic circuit designers faced, Rohde & Schwarz held an Electronic Design and Test Day for electronics enthusiast to gather and take away some tips in electronic design and testing.

Nine industry experts from Picotest, Texas Instrument, EyeKnowHow and Rohde & Schwarz share their design and test knowledge on DC/DC converters, DDR memory, ensuring power integrity, high speed interfaces and IoT wireless interface. Register and watch the sessions here.

Design and Test Day

Key takeaway from event:

  • Steve Sandler, CEO of Picotest reminded the audience that both power integrity and signal integrity are inter related during the opening keynote speech. For distributed systems, the simple rule of thumb to achieve low noise, Steve said, “minimize interaction between network ports, maximizing isolation between network ports, minimizing self-generated noise within each network.”
  • Bernd Geck from Texas Instruments dived deep down until step-by-step process that engineers can follow to compensate a power converter for their DC/DC converter design.
  • Andres lbl from Rohde & Schwarz mentioned that control loop stability verification, switching analysis and EMI compliance are key to DC/DC converter design.
  • Stefan Stahuber from Rohde & Schwarz stressed that EMI pre-compliance test is during product development helps to save money and reduce time to market.
  • Martin Stumpf and Andrea D’Aquino from Rohde & Schwarz showed appropriate measurement and analysis tools to measure the impedance of power deliver network.
  • Hermann Ruckerbauer from EyeKnowHow assured the audience, “the more work you spend on verifying the memory interface in the beginning, the less effort you can spend at the later end for re-qualification.”
  • Guido Schulze and Anja Paula from Rohde & Schwarz discussed the methodology and tools for debugging high speed digital designs with data rate up to 5Gbps.
  • Joerg Koepp from Rohde & Schwarz explored the wireless IoT interfaces impact to the rest of your electronic design.

Register and watch all the presentation here.

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