Synopsys RF Design Solutions Enhance Productivity, Speed Design Closure on Samsung Foundry’s Low-power Process
The 8nm RF design reference flow enhances time-to-results, quality-of-results and cost-of-results for next-generation RF design.
Synopsys, Arm Strengthen Partnership to Advance Next-Gen Mobile SoCs
Synopsys and Arm continue to deepen and broaden collaboration activities to accelerate time-to-market through highly optimized and silicon-ready system design…
Synopsys Unveils RF Design Flow for TSMC N6RF Process
Synopsys' new RF design flow, developed with Ansys and Keysight for the TSMC N6RF process, boosts 5G SoC development productivity.
Synopsys Launches ML-Driven Big Data Analytics Technology
Synopsys' DesignDash is a comprehensive data-visibility and machine intelligence-guided design optimization solution that enables unmatched productivity in advanced SoC design.
Synopsys Study Highlights Challenges with Managing Open Source Risk in Software Supply Chains
Analysis of more than 2,400 commercial and proprietary codebases finds decreases in open source license and vulnerability risks, but 88%…
Synopsys Improves Interoperability Between CODE V and LightTools
The enhanced interoperability between Synopsys' CODE V and LightTools enables faster multi-domain optical simulations.
Easing PCIe 6.0 Integration
PCIe data rates are moving from 32G to 64G because of the data explosion and increasing bandwidth for high-performance computing…
Synopsys Research Finds Vulnerabilities in 97% of Applications
Synopsys' 2021 Software Vulnerability Snapshot report examines prevalence of vulnerabilities identified by Synopsys Application Security Testing Services.
Advanced Verification: Unlocking the Door to a New Era of AI Chips
A look at how chip manufacturers will have to adjust hardware architecture in order to accommodate ever-growing demand for increased…
Spirent and Synopsys Accelerating Silicon Development Time-to-Market
Spirent and Synopsys are working to deliver a networking SoC verification solution to bridge the gap between pre- and post-silicon…