Why Test & Measurement Matter to Wide Bandgap Semiconductors?

Article By : Maurizio Di Paolo Emilio

Keysight's Alan Wadsworth and Mike Hawes review the critical aspects of Test and Measurement for analyzing wide-bandgap solutions.

Assessing the quality and durability of electronic devices is the domain of the test and measurement (T&M) function. T&M is particularly important for gallium nitride, both because of the wide-bandgap material’s immense potential to deliver the higher-efficiency power conversion need for emerging...

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